The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determfor each wafer in a sample size 100, resulting in the following frequencies:CumulativeCumulativeNumber of ParticlesFrequencyNumber of ParticlesFrequency88439.8826.10933181196429129754413996214100772a) What proportion of the sampled wafers had (P > 5) ?b) What proportion of the sampled wafers had between (4

according to the given details in the question.

Answered: II Cumulative Cumulative Number of…

Elements Of Electromagnetics

7th Edition

ISBN:9780190698614

Author:Sadiku, Matthew N. O.

Publisher:Sadiku, Matthew N. O.

ChapterMA: Math Assessment

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II Cumulative Cumulative Number of Particles Frequency Number of Particles Frequency 8 84 3 88 10 93 3 18 11 96 29 12 13 97 5 44 99 6 62 14 100 7 72 a) What proportion of the sampled wafers had (P> 5)? b) What proportion of the sampled wafers had between (4< P < 8)?